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National Science Foundation HomeNational Science Foundation - Directorate for Math and Physical Sciences (MPS)
Materials Research (DMR)
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Instrumentation for
Materials Research Highlights

0315565R. AdvinculaHoustonDevelopment and Acquisition of Surface Sensitive Electrochemical Instrumentation using Evanescent Wave and Nonlinear-Optical Techniques for Research and Education
0315491P. BoolchandCincinnatiVibrational Characterization of glasses using IR reflectance and Raman scattering
0421023D. BoyeDavidsonRare earths in sol-gels
0414649P. Caceres-ValenciaPuerto Rico - MayaguezzA Field Emission SEM to Promote Research and Education in Materials
0415187D. CahillIllinoisDevelopment of an Amplified Ultrafast Laser System with Time Resolved Electron Diffraction
0315775R. CarpickWisconsinCustom-Built Advanced Surface Science System
0414595H. ChanFloridaAcquistion of a scanning probe microscope for investigating fundamental interactions between surfaces and student training
0315634I. ChenPennsylvaniaAcquisition of Electron & X-ray Diffraction Equipment for Oxide Superlatitice Research and Education
0415840D. DillardVirginia PolytechnicAcquisition/Development of a Mixed Mode Fracture Testing Instrument for Research and Education in Adhesion Science
0414890A. GoldmanMinnesotaMagnetotransport Studies of Organic Spin Valves
0415345B. HsiaoStony BrookDevelopment of an X-ray Modified Rheometer for Synchrotron Polymer Research and Education
0320906C. KielyLehighAcquisition of an Aberration Corected Analytical Electron Microscope for Nanocharacterization of Materials
0215899K. KimberlinBradleyPentacene Molecules on the Si(111)-(7x7) Surface
0449933L. LauhonNorthwestern3-d Composition Mapping of Semiconductor Nanowires
0421521G. LiuUC DavisCombined confocal optical and atomic force microscope
0320992C. McConvilleAlfredAcquisition of a Environmental Scanning Electron Microscope for Research and Education
0216904J. MillerUtahSum-Frequency Generation Spectrometer
0417392D. MullerCornellAcquisition of an High Resolution Electron Spectrometer for Subnanometer Electron Microscopy Nanocharacterization Research and Education
0315290E. OlevskySan Diego StateAcquisition/Development of Equipment for Microwave Sintering In-Situ Characterization
0414935D. PochanDelawareIMR: Acquisition of a Small-Angle X-Ray Scattering Camera for Research and Education
0421366J. QuallsTexas - Pan AmericanMRI: Acquisition of Magnetic Field System with SQUID for Materials Research
0421253A. SchulteCentral FloridaAcquisition of a Novel Raman and Fourier-Transform Infrared Microscope for Research and Education in Bio-Materials, Nanoscience, and Forensics
0420532aD. SeidmanNorthwesternAtom-by-Atom Materials Analysis by LEAP Tomography
0420532bD. SeidmanNorthwesternThe Northwestern University LEAP Tomograph
0420532cD. SeidmanNorthwesternFe-Cu Alloy Investigated with the LEAP Tomograph
0215966A. SokolovAkronDevelopment of Scanning Nano-Raman Spectroscopy
0421376G. ThompsonAlabama - TuscaloosaMRI: Acquisition of an Advanced Analytical Transmission Electron Microscope
0321185T. ThorntonArizona StateAcquisition of Alignment, Bonding and Hot Embossing Tools for Hybrid Bioelectronic-Nanofluidic Systems
0416243E. UstundagIowa StateDevelopment of an Optimized Scanning X-Ray Microdiffraction System for Materials Research and Education
0321180M. WeaverAlabama - TuscaloosaAcquisition of a Field Emission Scanning Electron Microscope
0415838A. WollCornellDevelopment of a confocal x-ray fluorescence microscope for non-destructive characterization of historic paintings
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