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Bent, multi-wall nanotube on silicon dioxide

A bent, multi-wall nanotube on silicon dioxide


A bent, multi-wall nanotube on silicon dioxide. The tube is draped across a gold electrode (see insert), and was scanned using conductance imaging advanced force microscopy, a method that combines force microscopy and contact resistance measurements. The colors represent conductance data and the height gives topographical data. As the tube bends it forms buckles. The buckles have a different contact area to the tip than the rest of the tube and thus show up very nicely in the conductance data.

The National Science Foundation funded the nanomanipulator tool used to create this image. (Year of image: 2002)

Credit: Michael Stadermann, with thanks to the nano manipulator group at UNC-Chapel Hill, funded by NSF, NIH and DOD

Special Restrictions:
Permission is granted to use this image for personal, educational or nonprofit/non-commercial purposes only. Permission to use this image in a manner not stated here must be obtained from the owner, Michael Stadermann, at staderma@email.unc.edu.

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Images credited to the National Science Foundation, a federal agency, are in the public domain. The images were created by employees of the United States Government as part of their official duties or prepared by contractors as "works for hire" for NSF. You may freely use NSF-credited images and, at your discretion, credit NSF with a "Courtesy: National Science Foundation" notation. Additional information about general usage can be found in Conditions.

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