Multimedia Gallery - This slide highlights the ultra-nano-crystalline diamond (UNCD) atomic force microscope cantilever.

October 19, 2005

This slide highlights the ultra-nano-crystalline diamond (UNCD) atomic force microscope cantilever.

This slide highlights the ultra-nano-crystalline diamond (UNCD) atomic force microscope (AFM) cantilever. (a) This is a scanning-electron micrograph of a UNCD cantilever with a tip. (b) This is a scanning electron micrograph of a UNCD tip after one hour of scanning on a diamond substrate. Inset shows the tip before the scanning. (c) This is a frictional AFM image of an alkanethiol monolayer patterned onto a gold substrate with a UNCD tip. Researchers used the same tip for patterning and imaging. (d) This scanning electron micrograph shows a commercially available silicon nitride tip after one hour of scanning with the same parameters used for the UNCD tip in (b). The image shows damage at the tip apex while the inset shows the tip prior to the test.

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