Multimedia Gallery
April 6, 2012
Images and other media in the National Science Foundation Multimedia Gallery are available for use in print and electronic material by NSF employees, members of the media, university staff, teachers and the general public. All media in the gallery are intended for personal, educational and nonprofit/non-commercial use only.
Videos credited to the National Science Foundation, an agency of the U.S. Government, may be distributed freely. However, some materials within the videos may be copyrighted. If you would like to use portions of NSF-produced programs in another product, please contact the Video Team in the Office of Legislative and Public Affairs at the National Science Foundation.
Additional information about general usage can be found in Conditions.
Eyes of Science -- Innovators
Eyes of Science
Sometimes the biggest problems can be solved by looking at the tiniest details. Ondrej Krivanek, president of NION Co., and Philip Batson, research professor at Rutgers University, are part of a collaboration to build one of the world's most advanced electron microscopes. With support from NSF, they hope this tool will enable scientists to study and improve everything from nanomaterials to solar cells.
Credit: National Science Foundation
Images and other media in the National Science Foundation Multimedia Gallery are available for use in print and electronic material by NSF employees, members of the media, university staff, teachers and the general public. All media in the gallery are intended for personal, educational and nonprofit/non-commercial use only.
Videos credited to the National Science Foundation, an agency of the U.S. Government, may be distributed freely. However, some materials within the videos may be copyrighted. If you would like to use portions of NSF-produced programs in another product, please contact the Video Team in the Office of Legislative and Public Affairs at the National Science Foundation.
Additional information about general usage can be found in Conditions.