News From the Field
Radiation Damage Bigger Problem in Microelectronics Than Previously Thought
July 19, 2012
The amount of damage that radiation causes in electronic materials may be at least 10 times greater than previously thought. That is the surprising result of a new characterization method that uses a combination of lasers and acoustic waves to allow scientists to peer through solid materials and pinpoint the size and location of defects buried deep inside with unprecedented precision.
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