Title Slide Words: Partnerships at the Frontier: Accelerating Innovation 2005
Arden L. Bement, Jr., Acting Director, National Science Foundation
Title Slide Images:
Top: Two frictional atomic force microscopy images of features patterned by a nanofountain probe. Patterns have line widths as thin as 40 nanometers.The left image shows the letter N. The line widths on the letter "N" are as thin as 40 nanometers. The image on the right show series of lines less than 10 microns long. The inset on the right-side image shows pattern detail.
Center: Scanning electron micrograph of the top view of a porous-silicon wafer
Bottom: Scanning electron micrograph of the side view of a porous-silicon wafer
Top: © 2005 Horacio D. Espinosa
Center and Bottom: University of Rochester; BetaBatt, Inc.