Typical device used to measure electrical resistivity
An example of a typical device that scientists at Brookhaven National Laboratory use to measure electrical resistivity as a function of temperature and magnetic field. The scientists grew the film via atomic layer-by-layer molecular beam epitaxy, patterned it into a device and wire bonded it to a chip carrier.
[High-field resistivity measurements for this study were performed at the National High Magnetic Field Laboratory Pulsed Field Facility, which is supported in part by the National Science Foundation under grant DMR 1157490, as well as additional NSF funding through grant PHY 10-66293.]
Learn more about this research in the Brookhaven news story Lining up the surprising behaviors of a superconductor with one of the world's strongest magnets. (Date image taken: unknown; date originally posted to NSF Multimedia Gallery: Aug. 19, 2019)
Credit: Courtesy of Brookhaven National Laboratory
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