SEM micrograph showing tip of developing ear of maize
A scanning electron micrograph showing the tip (gray) of a developing ear of maize only 5 millimeters long, which grows abnormally due to mutations in genes that impact the plant’s growth and immune defenses.
[Research supported by U.S. National Science Foundation grant IOS 1936492.]
Learn more in the Cold Spring Harbor Lab news story Shifting the balance of growth vs. defense boosts crop yield. (Date image taken: Nov. 10, 2019; date originally posted to NSF Multimedia Gallery: Nov. , 2021)
Credit: Fang Xu, Cold Spring Harbor Lab
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