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July 18, 2005

Bent, multi-wall nanotube on silicon dioxide

A bent, multi-wall nanotube on silicon dioxide. The tube is draped across a gold electrode (see insert), and was scanned using conductance imaging advanced force microscopy, a method that combines force microscopy and contact resistance measurements. The colors represent conductance data and the height gives topographical data. As the tube bends it forms buckles. The buckles have a different contact area to the tip than the rest of the tube and thus show up very nicely in the conductance data.

The National Science Foundation funded the nanomanipulator tool used to create this image. (Year of image: 2002)

Credit: Michael Stadermann, with thanks to the nano manipulator group at UNC-Chapel Hill, funded by NSF, NIH and DOD

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