News From the Field
Femtogram-level Chemical Measurements Now Possible, U. of I. Team Reports
March 27, 2008
Finding a simple and convenient technique that combines nanoscale structural measurements and chemical identification has been an elusive goal. With current analytical instruments, spatial resolution is too low, signal-to-noise ratio too poor, sample preparation too complex or sample size too large to be of good service. Now, researchers at the University of Illinois have demonstrated a method for simultaneous structural and chemical characterization of samples at the femtogram level.
University of Illinois at Urbana-Champaign
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