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Femtogram-level Chemical Measurements Now Possible, U. of I. Team Reports


March 27, 2008

William King research group Finding a simple and convenient technique that combines nanoscale structural measurements and chemical identification has been an elusive goal. With current analytical instruments, spatial resolution is too low, signal-to-noise ratio too poor, sample preparation too complex or sample size too large to be of good service. Now, researchers at the University of Illinois have demonstrated a method for simultaneous structural and chemical characterization of samples at the femtogram level. Full Story

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University of Illinois at Urbana-Champaign

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