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News From the Field

Magnetic Test Technique Helps Ensure Reliability of Microelectronics, PV Cells and MEMS


April 11, 2012

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Taking advantage of the force generated by magnetic repulsion, researchers have developed a new technique for measuring the adhesion strength between thin films of materials used in microelectronic devices, photovoltaic cells and microelectromechanical systems. Full Story

Source
Georgia Institute of Technology Research News

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