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News From the Field

Radiation Damage Bigger Problem in Microelectronics Than Previously Thought


July 19, 2012

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The amount of damage that radiation causes in electronic materials may be at least 10 times greater than previously thought. That is the surprising result of a new characterization method that uses a combination of lasers and acoustic waves to allow scientists to peer through solid materials and pinpoint the size and location of defects buried deep inside with unprecedented precision. Full Story

Source
Vanderbilt University

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