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No compromises: JILA's short, flexible, reusable AFM probe


April 8, 2014

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JILA researchers have engineered a short, flexible, reusable probe for the atomic force microscope (AFM) that enables state-of-the-art precision and stability in picoscale force measurements. Shorter, softer and more agile than standard and recently enhanced AFM probes, the JILA tips will benefit nanotechnology and studies of folding and stretching in biomolecules such as proteins and DNA. Full Story

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National Institute of Standards and Technology (NIST)

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