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Press Release 05-075

Silicon Solution Could Lead to a Truly Long-life Battery

New devices may provide power for decades

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Wafer Test Fixture that the researchers used to test the new porous-silicon diode

Lead author Wei Sun of the University of Rochester holds the wafer test fixture the researchers used to test the new porous-silicon diode and its interactions with tritium gas. The diode is the dark wafer in the center of the top plate.

Credit: University of Rochester; BetaBatt, Inc.


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Scanning electron micrograph of the side view of the porous-silicon wafer

This is a scanning electron micrograph of the side view of the porous-silicon wafer as tested by the researchers.

Credit: University of Rochester; BetaBatt, Inc.


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Scanning electron micrograph of the top view of the porous-silicon wafer

This is a scanning electron micrograph of the top view of a porous-silicon wafer as tested by the researchers.

Credit: University of Rochester; BetaBatt, Inc.


Download the high-resolution JPG version of the image. (1.4 MB)

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