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The iSEM scanning electron microscope simulator brings the teaching power of an expensive laboratory tool into the hands of elementary school children. Test drive the iSEM scanning electron microscope simulator at http://www.nsf.gov/news/newsmedia/SEM/SEMviewer_NSF.swf
Credit: RJ Lee Group
Emergency response personnel from the Topeka, Kan., fire department test FAST-ACT to determine its ability to suppress vapors from a leaking propane tank.
Credit: NanoScale Materials, Inc.; NSF; Image use prohibited without approval from NanoScale.
Penelope SIS prepares for her surgical debut.
Credit: Courtesy of NewYork-Presbyterian Hospital
Portrait of Benjamin Franklin by artist David Martin (1737-1797)
Credit: Library of Congress, LC-USZC4-3576
A kindergartner examines a Talking Tactile Tablet picture of a flower. The picture was made by her teacher at Crofton Elementary School in Crofton, Md.
Credit: Erica Ziegler
Unlike other part searches, the 3D-Seek software rapidly locates objects with only a few quick steps.
Credit: Imaginestics, LLC
Wei Sun of the University of Rochester holds the wafer test fixture researchers used to test the interactions of the new porous-silicon diode with tritium gas. The diode is the dark wafer in the center of the top plate.
Credit: University of Rochester; BetaBatt, Inc.